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ATS
2005
IEEE
132views Hardware» more  ATS 2005»
15 years 8 months ago
Concurrent Test Generation
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
Vishwani D. Agrawal, Alok S. Doshi
ATAL
2007
Springer
15 years 6 months ago
Confidence-based policy learning from demonstration using Gaussian mixture models
We contribute an approach for interactive policy learning through expert demonstration that allows an agent to actively request and effectively represent demonstration examples. I...
Sonia Chernova, Manuela M. Veloso
IJCAI
2007
15 years 4 months ago
Semi-Supervised Learning of Attribute-Value Pairs from Product Descriptions
We describe an approach to extract attribute-value pairs from product descriptions. This allows us to represent products as sets of such attribute-value pairs to augment product d...
Katharina Probst, Rayid Ghani, Marko Krema, Andrew...
MLDM
2007
Springer
15 years 9 months ago
Transductive Learning from Relational Data
Transduction is an inference mechanism “from particular to particular”. Its application to classification tasks implies the use of both labeled (training) data and unlabeled (...
Michelangelo Ceci, Annalisa Appice, Nicola Barile,...
ACE
2004
315views Education» more  ACE 2004»
15 years 4 months ago
Applying SPICE to e-Learning: An e-Learning Maturity Model?
The Capability Maturity Model and SPICE approach to software process improvement has resulted in a robust system for improving development process capability in the field of softw...
Stephen Marshall, Geoff Mitchell