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181
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ICST
2010
IEEE
15 years 2 months ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
154
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SIGCSE
2008
ACM
15 years 4 months ago
2008
ACM
Coercing new programmers to adopt disciplined development practices such as thorough unit testing is a challenging endeavor. Test-driven development (TDD) has been proposed as a s...
128
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BMCBI
2010
15 years 4 months ago
2010
Background: Microarray experiments examine the change in transcript levels of tens of thousands of genes simultaneously. To derive meaningful data, biologists investigate the resp...
143
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IOLTS
2007
IEEE
15 years 10 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
118
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ICSE
2009
IEEE-ACM
15 years 11 months ago
2009
IEEE-ACM
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...