1099 search results - page 28 / 220 » Least-Squares Independence Test |
ICASSP
2009
IEEE
15 years 5 months ago
2009
IEEE
In this paper, we propose two approaches for combining geometric information with ICA algorithm to solve permutation problem under the scenario where a rough information about the...
ATS
2005
IEEE
15 years 3 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
MA
2010
Springer
14 years 8 months ago
2010
Springer
The problem of subsampling in two-sample and K-sample settings is addressed where both the data and the statistics of interest take values in general spaces. We focus on the case ...
DATE
2005
IEEE
15 years 4 days ago
2005
IEEE
Carefully tested electric/electronic components are a requirement for effective hardware-in-the-loop tests and vehicle tests in automotive industry. A new method for definition an...
99
Voted
ASPDAC
2007
ACM
15 years 2 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...