1099 search results - page 46 / 220 » Least-Squares Independence Test |
DATE
2005
IEEE
15 years 4 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
ATS
2003
IEEE
15 years 3 months ago
2003
IEEE
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
VTS
1998
IEEE
15 years 2 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
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INLG
2010
Springer
14 years 8 months ago
2010
Springer
Critical software most often requires an independent validation and verification (IVV). IVV is usually performed by domain experts, who are not familiar with specific, many times ...