1099 search results - page 47 / 220 » Least-Squares Independence Test |
ICCD
2006
IEEE
15 years 7 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
CCECE
2006
IEEE
15 years 4 months ago
2006
IEEE
The purpose of this paper is to use the aspect-oriented programming (AOP) paradigm for security testing. AOP allows security experts to develop and inject separate modules for con...
ITC
2003
IEEE
15 years 3 months ago
2003
IEEE
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
TC
2008
14 years 10 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
AIMS
2009
Springer
15 years 5 months ago
2009
Springer
The IETF has developed a network configuration management protocol called NETCONF which was published as proposed standard in 2006. The NETCONF protocol provides mechanisms to in...