The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
This paper discusses the impact of migrating from 2-D to 3-D on floorplanning and placement. By looking at a basic formulation of graph cuboidal dual problem, we show that the 3-...
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
Operating an integrated circuit at the prescribed nominal supply voltage is not preferable for reliable circuit operation under temperature fluctuations. A design methodology base...
With the advent of portable and high-density microelectronic devices, the power dissipation of integrated circuits has become a critical concern. Accurate and e cient power estimat...