239 search results - page 43 / 48 » Lectures on VLSI and Integrated Circuit Design |
DAC
2003
ACM
15 years 10 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
In this paper, we propose the first wire density driven global routing that considers CMP variation and timing. To enable CMP awareness during global routing, we propose a compac...
VLSID
2005
IEEE
15 years 3 months ago
2005
IEEE
Abstract—Integrated power supplies are critical building blocks in stateof-the-art portable applications, where they efficiently and accurately transform a battery supply into va...
ISLPED
2003
ACM
15 years 2 months ago
2003
ACM
Power dissipation is unevenly distributed in modern microprocessors leading to localized hot spots with significantly greater die temperature than surrounding cooler regions. Exc...
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CASES
2009
ACM
15 years 2 months ago
2009
ACM
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...