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CODES
2006
IEEE
15 years 9 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
107
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DASFAA
2006
IEEE
15 years 9 months ago
2006
IEEE
straction for Information Management Michael Franklin University of California, Berkeley Alon Halevy Google Inc. and U. Washington David Maier Portland State University The develo...
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Functional unit shutdown based on MTCMOS devices is effective for leakage reduction in aggressively scaled technologies. However, the applicability of MTCMOS-based shutdown in a s...
131
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
Instruction set simulators are common tools used for the development of new architectures and embedded software among countless other functions. This paper presents a framework th...
105
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...