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ISESE
2006
IEEE
15 years 9 months ago
Evaluating the efficacy of test-driven development: industrial case studies
This paper discusses software development using the Test Driven Development (TDD) methodology in two different environments (Windows and MSN divisions) at Microsoft. In both these...
Thirumalesh Bhat, Nachiappan Nagappan
ISQED
2006
IEEE
109views Hardware» more  ISQED 2006»
15 years 9 months ago
Dual-K Versus Dual-T Technique for Gate Leakage Reduction : A Comparative Perspective
As a result of aggressive technology scaling, gate leakage (gate oxide direct tunneling) has become a major component of total power dissipation. Use of dielectrics of higher perm...
Saraju P. Mohanty, Ramakrishna Velagapudi, Elias K...
ISQED
2006
IEEE
155views Hardware» more  ISQED 2006»
15 years 9 months ago
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
Bin Zhang, Wei-Shen Wang, Michael Orshansky
SBACPAD
2006
IEEE
148views Hardware» more  SBACPAD 2006»
15 years 9 months ago
Scalable Parallel Implementation of Bayesian Network to Junction Tree Conversion for Exact Inference
We present a scalable parallel implementation for converting a Bayesian network to a junction tree, which can then be used for a complete parallel implementation for exact inferen...
Vasanth Krishna Namasivayam, Animesh Pathak, Vikto...
SSDBM
2006
IEEE
167views Database» more  SSDBM 2006»
15 years 9 months ago
Exploring Data Streams with Nonparametric Estimators
A variety of real-world applications requires a meaningful online analysis of transient data streams. An important building block of many analysis tasks is the characterization of...
Christoph Heinz, Bernhard Seeger