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109
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ICCAD
2006
IEEE
15 years 10 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
ICCAD
2005
IEEE
15 years 10 months ago
2005
IEEE
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
122
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ICCAD
2004
IEEE
15 years 10 months ago
2004
IEEE
— Cycle-accurate functional descriptions (CAFDs) are being widely adopted in integrated circuit (IC) design flows. Power estimation can potentially benefit from the inherent in...
ICCAD
2003
IEEE
15 years 10 months ago
2003
IEEE
Ultra-deep submicron manufacturability impacts physical design (PD) through complex layout rules and large guardbands for process variability; this creates new requirements for ne...
119
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ICCAD
2001
IEEE
15 years 10 months ago
2001
IEEE
The use of nanometer technologies is making it increasingly important to consider transient characteristics of a circuit’s power dissipation (e.g., peak power, and power gradien...