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ICCD
2003
IEEE
145views Hardware» more  ICCD 2003»
15 years 10 months ago
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
Bernd Könemann
ICCAD
2002
IEEE
103views Hardware» more  ICCAD 2002»
15 years 10 months ago
A realistic variable voltage scheduling model for real-time applications
Voltage scheduling is indispensable for exploiting the benefit of variable voltage processors. Though extensive research has been done in this area, current processor limitations...
Bren Mochocki, Xiaobo Sharon Hu, Gang Quan
DATE
2007
IEEE
84views Hardware» more  DATE 2007»
15 years 7 months ago
On test generation by input cube avoidance
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
Irith Pomeranz, Sudhakar M. Reddy
INFOCOM
2006
IEEE
15 years 7 months ago
Information Dissemination in Power-Constrained Wireless Networks
— Dissemination of common information through broadcasting is an integral part of wireless network operations such as query of interested events, resource discovery and code upda...
Rong Zheng
WIOPT
2006
IEEE
15 years 7 months ago
Achievable performance improvements provided by cooperative diversity
— This paper examines the achievable performance gains when a particular class of cooperative relaying known as best-select is employed. In essence, best-select seeks to improve ...
Stephan Bohacek