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TCAD
2002
134views more  TCAD 2002»
14 years 9 months ago
DS-LFSR: a BIST TPG for low switching activity
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
Seongmoon Wang, Sandeep K. Gupta
ISBI
2011
IEEE
14 years 1 months ago
Sparse topological data recovery in medical images
For medical image analysis, the test statistic of the measurements is usually constructed at every voxels in space and thresholded to determine the regions of significant signals...
Moo K. Chung, Hyekyoung Lee, Peter T. Kim, Jong Ch...
VLSID
2002
IEEE
78views VLSI» more  VLSID 2002»
15 years 10 months ago
Optimization of Test Accesses with a Combined BIST and External Test Scheme
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
Makoto Sugihara, Hiroto Yasuura
ISVC
2007
Springer
15 years 4 months ago
Boosting with Temporal Consistent Learners: An Application to Human Activity Recognition
We present a novel boosting algorithm where temporal consistency is addressed in a short-term way. Although temporal correlation of observed data may be an important cue for classi...
Pedro Canotilho Ribeiro, Plinio Moreno, José...
LPAR
2010
Springer
14 years 8 months ago
The Consistency of the CADIAG-2 Knowledge Base: A Probabilistic Approach
Abstract. The paper presents the methodology and the results of checking consistency of the knowledge base of CADIAG-2, a large-scale medical expert system. Such knowledge base con...
Pavel Klinov, Bijan Parsia, David Picado-Mui&ntild...