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TC
2008
14 years 9 months ago
Low-Transition Test Pattern Generation for BIST-Based Applications
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
FATES
2006
Springer
15 years 1 months ago
A Test Calculus Framework Applied to Network Security Policies
Abstract. We propose a syntax-driven test generation technique to auly derive abstract test cases from a set of requirements expressed in a linear temporal logic. Assuming that an ...
Yliès Falcone, Jean-Claude Fernandez, Laure...
UAI
2001
14 years 11 months ago
Instrumentality Tests Revisited
An instrument is a random variable that is uncorrelated with certain (unobserved) error terms and, thus, allows the identification of structural parameters in linear models. In no...
Blai Bonet
CORR
2010
Springer
124views Education» more  CORR 2010»
14 years 7 months ago
Property Testing via Set-Theoretic Operations
: Given two testable properties P1 and P2, under what conditions are the union, intersection or set-difference of these two properties also testable? We initiate a systematic study...
Victor Chen, Madhu Sudan, Ning Xie
ICASSP
2008
IEEE
15 years 4 months ago
Deploying GOOG-411: Early lessons in data, measurement, and testing
We describe our early experience building and optimizing GOOG-411, a fully automated, voice-enabled, business finder. We show how taking an iterative approach to system developme...
Michiel Bacchiani, Françoise Beaufays, Joha...