A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
Abstract. We propose a syntax-driven test generation technique to auly derive abstract test cases from a set of requirements expressed in a linear temporal logic. Assuming that an ...
An instrument is a random variable that is uncorrelated with certain (unobserved) error terms and, thus, allows the identification of structural parameters in linear models. In no...
: Given two testable properties P1 and P2, under what conditions are the union, intersection or set-difference of these two properties also testable? We initiate a systematic study...
We describe our early experience building and optimizing GOOG-411, a fully automated, voice-enabled, business finder. We show how taking an iterative approach to system developme...