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SIMPRA
2011
14 years 4 months ago
2011
We propose a method to detect the onset of linear trend in a time series and estimate the change point T from the profile of a linear trend test statistic, computed on consecutive...
ICIP
2003
IEEE
15 years 11 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
ICASSP
2011
IEEE
14 years 1 months ago
2011
IEEE
This paper investigates the performance of a new technique for speech enhancement which combines Linear Predictive (LP) spectrum-based perceptual filtering to the recordings obtai...
ISCAS
1999
IEEE
15 years 2 months ago
1999
IEEE
In this paper, we present a new method for verifying the realizability of a timing diagram with linear timing constraints, thus ensuring that the implementation of the underlying ...
ICIP
2010
IEEE
15 years 3 months ago
2010
IEEE
We propose a registration method to find affine transformations
between 3D objects by constructing and solving an
overdetermined system of polynomial equations. We utilize
voxel...