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DATE
2000
IEEE
110views Hardware» more  DATE 2000»
15 years 2 months ago
A BIST Scheme for On-Chip ADC and DAC Testing
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
CADE
2002
Springer
15 years 10 months ago
Testing Satisfiability of CNF Formulas by Computing a Stable Set of Points
We show that a conjunctive normal form (CNF) formula F is unsatisfiable iff there is a set of points of the Boolean space that is stable with respect to F. So testing the satisfiab...
Eugene Goldberg
ICASSP
2008
IEEE
15 years 4 months ago
Composite hypothesis testing by optimally distinguishable distributions
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...
Seyed Alireza Razavi, Ciprian Doru Giurcaneanu
SIAMCO
2008
98views more  SIAMCO 2008»
14 years 10 months ago
Kernel Density Estimation and Goodness-of-Fit Test in Adaptive Tracking
We investigate the asymptotic properties of a recursive kernel density estimator associated with the driven noise of a linear regression in adaptive tracking. We provide an almost ...
Bernard Bercu, Bruno Portier
IPPS
1998
IEEE
15 years 2 months ago
Testing of Synchronization Conditions for Distributed Real-Time Applications
A set of synchronization relations between distributed nonatomic events was recently proposed to provide real-time applications with a fine level of discrimination in the specifica...
Ajay D. Kshemkalyani