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DATE
2000
IEEE
110views Hardware» more  DATE 2000»
15 years 7 months ago
A BIST Scheme for On-Chip ADC and DAC Testing
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
CADE
2002
Springer
16 years 3 months ago
Testing Satisfiability of CNF Formulas by Computing a Stable Set of Points
We show that a conjunctive normal form (CNF) formula F is unsatisfiable iff there is a set of points of the Boolean space that is stable with respect to F. So testing the satisfiab...
Eugene Goldberg
ICASSP
2008
IEEE
15 years 9 months ago
Composite hypothesis testing by optimally distinguishable distributions
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...
Seyed Alireza Razavi, Ciprian Doru Giurcaneanu
SIAMCO
2008
98views more  SIAMCO 2008»
15 years 2 months ago
Kernel Density Estimation and Goodness-of-Fit Test in Adaptive Tracking
We investigate the asymptotic properties of a recursive kernel density estimator associated with the driven noise of a linear regression in adaptive tracking. We provide an almost ...
Bernard Bercu, Bruno Portier
IPPS
1998
IEEE
15 years 7 months ago
Testing of Synchronization Conditions for Distributed Real-Time Applications
A set of synchronization relations between distributed nonatomic events was recently proposed to provide real-time applications with a fine level of discrimination in the specifica...
Ajay D. Kshemkalyani