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ADBIS
2009
Springer
101views Database» more  ADBIS 2009»
15 years 2 months ago
Temporal Data Classification Using Linear Classifiers
Data classification is usually based on measurements recorded at the same time. This paper considers temporal data classification where the input is a temporal database that descri...
Peter Z. Revesz, Thomas Triplet
ISSTA
2009
ACM
15 years 4 months ago
Time-aware test-case prioritization using integer linear programming
Techniques for test-case prioritization re-order test cases to increase their rate of fault detection. When there is a fixed time budget that does not allow the execution of all ...
Lu Zhang, Shan-Shan Hou, Chao Guo, Tao Xie, Hong M...
DAC
2000
ACM
15 years 11 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
ASYNC
2006
IEEE
92views Hardware» more  ASYNC 2006»
15 years 4 months ago
Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
Gennette Gill, Ankur Agiwal, Montek Singh, Feng Sh...
ESEM
2009
ACM
15 years 1 months ago
Test coverage and post-verification defects: A multiple case study
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-...