3779 search results - page 81 / 756 » Linear Consistency Testing |
MCS
2007
Springer
14 years 10 months ago
2007
Springer
In this short note, we revisit the so-called Ermakov–Pinney (EP) equation viewing its properties from a physically motivated perspective. We discuss its ties with the Schr¨odin...
DDECS
2007
IEEE
15 years 4 months ago
2007
IEEE
— This paper describes a new self-testing 1-bit full adder. This circuit consists of three polymorphic NAND/NOR gates, two XOR gates and two inverters. The adder is able to detec...
SFP
2003
14 years 11 months ago
2003
Abstract In distance learning the lack of direct communication between teachers and learners makes it difficult to provide direct assistance to students while they are solving the...
ICST
2008
IEEE
15 years 4 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
ICCD
2003
IEEE
15 years 7 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...