3779 search results - page 84 / 756 » Linear Consistency Testing |
VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ISCAS
2003
IEEE
15 years 3 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
ICCAD
1999
IEEE
15 years 2 months ago
1999
IEEE
We present optimal solutions to the test scheduling problem for core-based systems. We show that test scheduling is equivalent to the m-processor open-shop scheduling problem and ...
ITC
1993
IEEE
15 years 2 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
MA
2010
Springer
14 years 8 months ago
2010
Springer
A general approach for developing distribution free tests for general linear models based on simplicial depth is applied to multiple regression. The tests are based on the asympto...