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DATE
1997
IEEE
109views Hardware» more  DATE 1997»
15 years 1 months ago
Sequential circuit test generation using dynamic state traversal
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
CORR
2008
Springer
108views Education» more  CORR 2008»
14 years 9 months ago
Efficient Isomorphism Testing for a Class of Group Extensions
Abstract. The group isomorphism problem asks whether two given groups are isomorphic or not. Whereas the case where both groups are abelian is well understood and can be solved eff...
François Le Gall
FATES
2004
Springer
15 years 3 months ago
Using Model Checking for Reducing the Cost of Test Generation
This paper presents a method for reducing the cost of test generation. A spanning set for a coverage criterion is a set of entities such that exercising every entity in the spannin...
Hyoung Seok Hong, Hasan Ural
CSDA
2010
175views more  CSDA 2010»
14 years 10 months ago
Testing, monitoring, and dating structural changes in exchange rate regimes
Linear regression models for de facto exchange rate regime classification are complemented by inferential techniques for evaluating the stability of the regimes. To simultaneously...
Achim Zeileis, Ajay Shah, Ila Patnaik
CORR
2009
Springer
115views Education» more  CORR 2009»
14 years 7 months ago
Testing the Equivalence of Regular Languages
The minimal deterministic finite automaton is generally used to determine regular languages equality. Using Brzozowski's notion of derivative, Antimirov and Mosses proposed a...
Marco Almeida, Nelma Moreira, Rogério Reis