A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
Approximate Linear Programming (ALP) is a reinforcement learning technique with nice theoretical properties, but it often performs poorly in practice. We identify some reasons for...
In apprenticeship learning, the goal is to learn a policy in a Markov decision process that is at least as good as a policy demonstrated by an expert. The difficulty arises in tha...
We consider the feedback vertex set and feedback arc set problems in bipartite tournaments. We improve on recent results by giving a 2-approximation algorithm for the feedback vert...
Dedicated machine constraint is one of the new challenges introduced in photolithography machinery of the semiconductor manufacturing system due to natural bias. Previous research...
Huy Nguyen Anh Pham, Arthur M. D. Shr, Peter P. Ch...