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ICCAD
2004
IEEE
15 years 11 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
117
Voted
ICCAD
2003
IEEE
15 years 11 months ago
2003
IEEE
– Many embedded system designs usually impose (hard) read-time constraints on tasks. Thus, computing a tight upper bound of the worst case execution time (WCET) of a software is ...
130
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ICCAD
2002
IEEE
15 years 11 months ago
2002
IEEE
Application-specific instructions can significantly improve the performance, energy, and code size of configurable processors. A common approach used in the design of such instruc...
112
Voted
CVPR
2010
IEEE
15 years 10 months ago
2010
IEEE
Recent advances in scene understanding and related tasks
have highlighted the importance of using regions to reason
about high-level scene structure. Typically, the regions are
...
ISPD
2010
ACM
15 years 9 months ago
2010
ACM
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...