In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
The max-sum classifier predicts n-tuple of labels from n-tuple of observable variables by maximizing a sum of quality functions defined over neighbouring pairs of labels and obser...
: Scattering of neutrons and x-rays from molecules in solution offers alternative approaches to the studying of a wide range of macromolecular structures in their solution state w...
Paritosh A. Kavathekar, Bruce A. Craig, Alan M. Fr...
We present a combinatorial characterization of the Bethe entropy function of a factor graph, such a characterization being in contrast to the original, analytical, definition of th...
We propose a web-based computer-assisted tool for diagnosing progress in international negotiation. The system is based on a general linear model. Innovative features of the progr...