Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...
Shallow trench isolation (STI) is the mainstream CMOS isolation technology. It uses chemical mechanical planarization (CMP) to remove excess of deposited oxide and attain a planar...
Andrew B. Kahng, Puneet Sharma, Alexander Zelikovs...
Optimized solvers for the Boolean Satisfiability (SAT) problem have many applications in areas such as hardware and software verification, FPGA routing, planning, etc. Further use...
Fadi A. Aloul, Arathi Ramani, Igor L. Markov, Kare...
Timing-driven placement is a critical step in nanometerscale physical synthesis. To improve design timing on a global scale, net-weight based global timing-driven placement is a c...
Natarajan Viswanathan, Gi-Joon Nam, Jarrod A. Roy,...