Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
Certain manufacturing steps in very deep submicron VLSI involve chemical-mechanical polishing CMP which has varying e ects on device and interconnect features, depending on loca...
Andrew B. Kahng, Gabriel Robins, Anish Singh, Alex...
— Presented in this paper is a joint algorithm optimization and architecture design framework for analysis of repetitive regularities. Two closely coupled algorithm optimization ...
—In this paper, we propose a low complexity linear multiuser beamforming system for the multiple-input multipleoutput (MIMO) broadcast channel. We consider the specific case of ...
Chan-Byoung Chae, David Mazzarese, Nihar Jindal, R...
We present a low-power sine-output Direct Digital Frequency Synthesizer (DDFS) realized in 0.18 µm CMOS that achieves 60 dBc spectral purity from DC to the Nyquist frequency. No ...