Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...
Rajeev R. Rao, Kaviraj Chopra, David Blaauw, Denni...
Abstract We are developing an integrated algorithm analysis and mapping environment particularly tailored for signal processing applications on Adaptive Computing Systems ACS. Our ...
Empirical filter designs generalize relationships inferred from training data to effect realistic solutions that conform well to the human visual system. Complex algorithms invol...
The increasing application space of interconnection networks now encompasses several applications, such as packet routing and I/O interconnect, where the throughput of a routing a...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...