Abstract We compare the performance of two database selection algorithms reported in the literature. Their performance is compared using a common testbed designed specifically for ...
James C. French, Allison L. Powell, James P. Calla...
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
Local ratio is a well-known paradigm for designing approximation algorithms for combinatorial optimization problems. At a very high level, a local-ratio algorithm first decomposes ...
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Digital Signal Processing (DSP) is becoming increasingly widespread in portable devices. Due to harsh constraints on power, latency, and throughput in embedded environments, devel...
Sitij Agrawal, William Thies, Saman P. Amarasinghe