11066 search results - page 1981 / 2214 » Linearity in Process Languages |
184
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WICOMM
2011
14 years 11 months ago
2011
Success of Wireless Sensor Networks (WSN) largely depends on whether the deployed network can provide desired area coverage with acceptable network lifetime. This paper seeks to a...
176
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SIAMIS
2010
14 years 11 months ago
2010
This article proposes a new method for image separation into a linear combination of morphological components. Sparsity in fixed dictionaries is used to extract the cartoon and osc...
129
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TCAD
2010
14 years 11 months ago
2010
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...
192
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TCAD
2010
14 years 11 months ago
2010
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
180
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TNN
2010
14 years 11 months ago
2010
Abstract--In this paper, the problem of stochastic synchronization analysis is investigated for a new array of coupled discretetime stochastic complex networks with randomly occurr...