2299 search results - page 373 / 460 » Logical Data Expiration |
ASPDAC
2009
ACM
15 years 5 months ago
2009
ACM
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
FCCM
2008
IEEE
15 years 5 months ago
2008
IEEE
This paper presents a proto-type autonomous signal processing system on a chip. The system is architected such that high performance digital signal processing occurs in the FPGAâ€...
HICSS
2008
IEEE
15 years 5 months ago
2008
IEEE
This paper describes the development of reliable and valid scales for assessing the strategic potential of IT-enabled resources. Following to the resource-based view of the firm (...
ICST
2008
IEEE
15 years 5 months ago
2008
IEEE
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...
ICYCS
2008
IEEE
15 years 5 months ago
2008
IEEE
A single physical machine provides multiple network monitoring and analysis services (e.g., IDS, QoS) which are installed on the same operating system. Isolation between services ...