2299 search results - page 432 / 460 » Logical Data Expiration |
ICSE
2011
IEEE-ACM
14 years 2 months ago
2011
IEEE-ACM
Considerable progress has been made towards automatic support for one of the principal techniques available to enhance program reliability: equipping programs with extensive contr...
DAC
2007
ACM
15 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2002
ACM
15 years 11 months ago
2002
ACM
Tools and a design methodology have been developed to support partial run-time reconfiguration of FPGA logic on the Field Programmable Port Extender. High-speed Internet packet pr...
DAC
2004
ACM
15 years 11 months ago
2004
ACM
Reconfigurable Systems-on-Chip (SoCs) on the market consist of full-fledged processors and large Field-Programmable Gate-Arrays (FPGAs). The latter can be used to implement the sy...
ICML
2005
IEEE
15 years 11 months ago
2005
IEEE
Many real-world domains exhibit rich relational structure and stochasticity and motivate the development of models that combine predicate logic with probabilities. These models de...