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106
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FTCS
1993
94views more  FTCS 1993»
15 years 3 months ago
Balance Testing of Logic Circuits
We present a new test response compression method called cumulative balance testing (CBT)that extends both balance testing and accumulatorcompression testing. CBT uses an accumulat...
Krishnendu Chakrabarty, John P. Hayes
77
Voted
TAP
2009
Springer
125views Hardware» more  TAP 2009»
15 years 8 months ago
Complementary Criteria for Testing Temporal Logic Properties
Gordon Fraser, Franz Wotawa
71
Voted
ISCAS
1999
IEEE
72views Hardware» more  ISCAS 1999»
15 years 6 months ago
Observing test response of embedded cores through surrounding logic
P. K. Jaini, Nur A. Touba