980 search results - page 41 / 196 » Logical Testing |
108
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ETS
2006
IEEE
15 years 8 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
239
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LPAR
2012
Springer
13 years 9 months ago
2012
Springer
Abstract. We present a novel counterexample generator for the interactive theorem prover Isabelle based on a compiler that synthesizes test data generators for functional programmi...
FATES
2003
Springer
15 years 7 months ago
2003
Springer
Abstract. In this paper we propose an approach to automatically produce test cases allowing to check the satis ability of a linear property on a given implementation. Linear proper...
112
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ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
112
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SPLC
2008
15 years 3 months ago
2008
The automated analysis of Feature Models (FMs) focuses on the usage of different logic paradigms and solvers to implement a number of analysis operations on FMs. The implementatio...