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» Low-Transition Test Pattern Generation for BIST-Based Applic...
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77
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VLSID
2002
IEEE
115views VLSI» more  VLSID 2002»
15 years 9 months ago
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Scan Circuits
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Irith Pomeranz, Sudhakar M. Reddy
70
Voted
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 1 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
EVOW
1999
Springer
15 years 1 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
82
Voted
ICCAD
1997
IEEE
147views Hardware» more  ICCAD 1997»
15 years 1 months ago
Built-in test generation for synchronous sequential circuits
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
Irith Pomeranz, Sudhakar M. Reddy
XPU
2004
Springer
15 years 2 months ago
Generative Acceptance Testing for Difficult-to-Test Software
Abstract. While there are many excellent acceptance testing tools and frameworks available today, this paper presents an alternative approach, involving generating code from tests ...
Jennitta Andrea