102 search results - page 6 / 21 » Low-Transition Test Pattern Generation for BIST-Based Applic... |
EVOW
2001
Springer
15 years 2 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
97
Voted
APSEC
2004
IEEE
15 years 1 months ago
2004
IEEE
Unit testing is a methodology for testing small parts of an application independently of whatever application uses them. It is time consuming and tedious to write unit tests, and ...
83
Voted
SEW
2007
IEEE
15 years 3 months ago
2007
IEEE
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
80
Voted
SIGSOFT
2007
ACM
15 years 10 months ago
2007
ACM
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
DFT
2002
IEEE
15 years 2 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...