165 search results - page 25 / 33 » Low-power circuits using dynamic threshold devices |
73
Voted
DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
FPGA
2007
ACM
15 years 3 months ago
2007
ACM
Power consumption in field programmable gate arrays (FPGAs) has become an important issue as the FPGA market has grown to include mobile platforms. In this work we present a power...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, timing, performance, cooling costs and leakage power. Conventional thermal managem...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
With technology advances, the number of cores integrated on a chip and their speed of operation is increasing. This, in turn is leading to a significant increase in chip temperat...
94
Voted
ICCAD
2003
IEEE
15 years 6 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...