165 search results - page 28 / 33 » Low-power circuits using dynamic threshold devices |
TCAD
2008
14 years 9 months ago
2008
Abstract--The fabrication of crossbar memories with sublithographic features is expected to be feasible within several emerging technologies; in all of them, the nanowire (NW) deco...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
—The dynamic programmable logic array (PLA) style has become popular in designing high-performance microprocessors because of its high speed and predictable routing delay. Howeve...
GLOBECOM
2006
IEEE
15 years 3 months ago
2006
IEEE
— WLAN hot-spots are becoming widely spread. This, combined with the availability of new multi-mode terminals integrating heterogeneous technologies, opens new business opportuni...
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VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
ISVLSI
2002
IEEE
15 years 2 months ago
2002
IEEE
The scaling trend of MOSFETs requires the supply and the threshold voltages to be reduced in future generations. Although the supply voltage is reduced, the total power dissipatio...