648 search results - page 72 / 130 » Lowness for Demuth Randomness |
DFT
2003
IEEE
15 years 3 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
ITC
1999
IEEE
15 years 2 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
ICCAD
1996
IEEE
15 years 2 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
AINA
2004
IEEE
15 years 1 months ago
2004
IEEE
Prior survey of RED algorithm deployment on multiqueue system with shared buffer was unfair and sensitive to congestion level by statically setting the parameters. In this paper, ...
EPEW
2006
Springer
15 years 1 months ago
2006
Springer
In this paper we experimentally investigate if optimal retry times can be determined based on models that assume independence of successive tries. We do this using data obtained fo...