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ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
15 years 3 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
ICDAR
2003
IEEE
15 years 3 months ago
Writer Identification using Innovative Binarised Features of Handwritten Numerals
The objective of this paper is to present a number of features that can be extracted from handwritten digits and used for author verification or identification of a person’s han...
Graham Leedham, Sumit Chachra
ISQED
2003
IEEE
233views Hardware» more  ISQED 2003»
15 years 3 months ago
Active Device under Bond Pad to Save I/O Layout for High-pin-count SOC
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-Â...
Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang
ISSRE
2003
IEEE
15 years 3 months ago
Test-Driven Development as a Defect-Reduction Practice
Test-driven development is a software development practice that has been used sporadically for decades. With this practice, test cases (preferably automated) are incrementally wri...
Laurie A. Williams, E. Michael Maximilien, Mladen ...
MIR
2003
ACM
391views Multimedia» more  MIR 2003»
15 years 3 months ago
Generic sign board detection in images
Sign board detection is important for such computer vision applications as video surveillance and content based visual information retrieval. Previous researches on this topic foc...
Hua Shen, Xiaoou Tang