Computer system reliability is conventionally modeled and analyzed using techniques such as fault tree analysis (FTA) and reliability block diagrams (RBD), which provide static rep...
Ryan Robidoux, Haiping Xu, Liudong Xing, MengChu Z...
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
The designer of a system on a chip (SoC) that connects IP cores through a network on chip (NoC) needs methods to support application performance evaluation. Two key aspects these ...
Leonel Tedesco, Aline Mello, Diego Garibotti, Ney ...