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DAC
2009
ACM
16 years 25 days ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
DAC
2008
ACM
16 years 25 days ago
Multithreaded simulation for synchronous dataflow graphs
Synchronous dataflow (SDF) has been successfully used in design tools for system-level simulation of wireless communication systems. Modern wireless communication standards involv...
Chia-Jui Hsu, José Luis Pino, Shuvra S. Bha...
DAC
2008
ACM
16 years 25 days ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
DAC
2007
ACM
16 years 25 days ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2007
ACM
16 years 25 days ago
Fast Second-Order Statistical Static Timing Analysis Using Parameter Dimension Reduction
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
Zhuo Feng, Peng Li, Yaping Zhan