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MVA
2007
146views Computer Vision» more  MVA 2007»
15 years 5 months ago
A SVM Based Method to Detect Color Shift Defects in IC Packages
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari
AIPS
2004
15 years 5 months ago
Statistical Goal Parameter Recognition
We present components of a system which uses statistical, corpus-based machine learning techniques to perform instantiated goal recognition -- recognition of both a goal schema an...
Nate Blaylock, James F. Allen
116
Voted
CVIU
1999
104views more  CVIU 1999»
15 years 4 months ago
Interactively Matching Hand-Drawings Using Induction
In this paper we consider the task of matching patterns, as occur in hand-drawn symbols and schematic diagrams, by their parts and relationships. Of particular interest for comput...
Adrian R. Pearce, Terry Caelli
PROCEDIA
2010
85views more  PROCEDIA 2010»
15 years 2 months ago
Toward interactive statistical modeling
When solving machine learning problems, there is currently little automated support for easily experimenting with alternative statistical models or solution strategies. This is be...
Sooraj Bhat, Ashish Agarwal, Alexander Gray, Richa...
CADE
2008
Springer
16 years 4 months ago
Combining Theorem Proving with Natural Language Processing
Abstract. The LogAnswer system is an application of automated reasoning to the field of open domain question-answering, the retrieval of answers to natural language questions regar...
Björn Pelzer, Ingo Glöckner