308 search results - page 27 / 62 » Macromodeling of analog circuits for hierarchical circuit de... |
ISQED
2008
IEEE
15 years 4 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
With the thermal effect, improper analog placements may degrade circuit performance because the thermal impact from power devices can affect electrical characteristics of the ther...
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
MSE
1999
IEEE
15 years 2 months ago
1999
IEEE
This paper presents a PC based software running on PC dedicated to the training in sub-micron CMOS VLSI design. The software firstly consists in a HDL-based schematic editor with ...
ISCAS
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper presents a cell library for automatic synthesis of analog error control decoders. By using some basic cells, analog error control decoders can be automatically synthesi...