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114
Voted
DFT
2004
IEEE
92views VLSI» more  DFT 2004»
15 years 7 months ago
Reliability and Yield: A Joint Defect-Oriented Approach
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
Roman Barsky, Israel A. Wagner
WSC
2001
15 years 5 months ago
Teaching manufacturing systems simulation in a computer aided teaching studio
A computer aided teaching studio provides a unique environment for teaching an introductory simulation course to manufacturing engineers. Each meeting can consist of an appropriat...
Charles R. Standridge
131
Voted
FMOODS
2003
15 years 5 months ago
Proof Scores in the OTS/CafeOBJ Method
A way to write proof scores showing that distributed systems have invariant properties in algebraic specification languages is described, which has been devised through several ca...
Kazuhiro Ogata, Kokichi Futatsugi
131
Voted
AISM
2004
15 years 5 months ago
Developing a framework for understanding Security Governance
With reported security incidents in organisations on the increase, effective Security Governance is expected to become a major issue in organisations. A research framework of Secu...
C. C. Terence Tan
117
Voted
CCIA
2005
Springer
15 years 9 months ago
Using symbolic descriptions to explain similarity on CBR
The explanation of the results is a key point of automatic problem solvers. CBR systems solve a new problem by assessing its similarity with already solved cases and they commonly ...
Eva Armengol, Enric Plaza