This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
David Fick, Andrew DeOrio, Jin Hu, Valeria Bertacc...
We present new methods to extend data reliability of disks in RAID systems for applications like long term data archival. The proposed solutions extend existing algorithms to detec...
Abstract. This paper addresses the problem of data placement, indexing, and querying large XML data repositories distributed over an existing P2P service infrastructure. Our archit...
Leonidas Fegaras, Weimin He, Gautam Das, David Lev...
In this paper we present an approach to the scheduling and voltage scaling of low-power fault-tolerant hard real-time applications mapped on distributed heterogeneous embedded sys...