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128
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VTS
2008
IEEE
15 years 9 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
129
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ICCS
2004
Springer
15 years 8 months ago
2004
Springer
A new Bayer pattern demosaicking scheme for single-sensor digital cameras is introduced. The raw output from a sensor, mostly a charge coupled device (CCD) or a complementary metal...
118
Voted
WER
2004
Springer
15 years 8 months ago
2004
Springer
At present, the early phase of Requirements Engineering is a new research area in the Software Engineering field. This phase is concerned with the analysis of the organizational c...
114
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PAKDD
2010
ACM
15 years 8 months ago
2010
ACM
Abstract. The definition of a community in social networks varies with applications. To generalize different types of communities, the concept of linkpattern based community was pr...
146
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ACMIDC
2010
15 years 7 months ago
2010
COSPATIAL is a multi-disciplinary project that is using collaborative virtual reality and tabletop devices for training social competence within the theoretical framework of Cogni...