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» Mean-Field Analysis of Buffer Sizing
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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
15 years 10 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
ICCAD
2001
IEEE
100views Hardware» more  ICCAD 2001»
15 years 7 months ago
Coupled Analysis of Electromigration Reliability and Performance in ULSI Signal Nets
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Kaustav Banerjee, Amit Mehrotra
PE
2006
Springer
130views Optimization» more  PE 2006»
14 years 10 months ago
Analysis of manufacturing blocking systems with Network Calculus
In this paper, the manufacturing blocking system (MBS) is studied from the Network Calculus (NetCal) perspective. By dominating an MBS by a window flow controller (WFC), we obtain...
Amit Bose, Xiaoyue Jiang, Bin Liu, Gang Li

Publication
261views
16 years 8 months ago
Improving Explicit Congestion Notification with the Mark-Front Strategy
Delivering congestion signals is essential to the performance of networks. Current TCP/IP networks use packet losses to signal congestion. Packet losses not only reduces TCP perfor...
Chunlei Liu, Raj Jain,
DAC
1997
ACM
15 years 2 months ago
Power Supply Noise Analysis Methodology for Deep-Submicron VLSI Chip Design
This paper describes a new design methodology to analyze the on-chip power supply noise for high performance microprocessors. Based on an integrated package-level and chip-level p...
Howard H. Chen, David D. Ling