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CSCWD
2009
Springer
15 years 4 months ago
2009
Springer
Constrained random simulation methodology still plays an important role in hardware verification due to the limited scalability of formal verification, especially for the large an...
ISSRE
2005
IEEE
15 years 3 months ago
2005
IEEE
A classic question in software development is “H ow much testing is enough?” Aside from dynamic coverage-based metrics, there are few measures that can be used to provide guid...
KDD
1998
ACM
15 years 1 months ago
1998
ACM
This paper develops the concept of usefulness in the context of supervised learning. We argue that usefulness can be used to improve the performance of classification rules (as me...
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
SERP
2003
14 years 11 months ago
2003
The Java Data Objects (JDO) industry standard appears to provide a promising framework for persisting Java objects in an efficient way. Many experts even regard JDO as a more appr...