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SKG
2006
IEEE
15 years 5 months ago
Ontology Enabled Learning Resource Modeling and Management
In this paper, we proposed the learning resource ontology(LRO) models to formally describe learning content and learning context, respectively. In addition to utilizing the models...
Zongkai Yang, Tao Huang, Qingtang Liu, Xia Li, Bei...
DATE
2005
IEEE
204views Hardware» more  DATE 2005»
15 years 4 months ago
Evaluation of Error-Resilience for Reliable Compression of Test Data
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
Hamidreza Hashempour, Luca Schiano, Fabrizio Lomba...
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
15 years 3 months ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi
VLSID
1998
IEEE
117views VLSI» more  VLSID 1998»
15 years 3 months ago
Partial Scan Selection Based on Dynamic Reachability and Observability Information
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. R...
BMCBI
2010
130views more  BMCBI 2010»
14 years 11 months ago
Analysis of DNA strand-specific differential expression with high density tiling microarrays
Background: DNA microarray technology allows the analysis of genome structure and dynamics at genome-wide scale. Expression microarrays (EMA) contain probes for annotated open rea...
Luis Quintales, Mar Sánchez, Francisco Ante...