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160
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MICRO
2009
IEEE
15 years 11 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
143
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DAC
2010
ACM
15 years 8 months ago
2010
ACM
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...
134
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DAC
2010
ACM
15 years 8 months ago
2010
ACM
Operating at the intersection of multiple sensing and control systems designed for occupant comfort, performability and operational efficiency, modern buildings represent a protot...
133
Voted
DAC
2009
ACM
15 years 11 months ago
2009
ACM
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
107
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
this paper proposes a novel Process Variation Aware SRAM architecture designed to inherently support voltage scaling. The peripheral circuitry of the SRAM is modified to selectivel...