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ASPLOS
2011
ACM
14 years 1 months ago
2011
ACM
Concurrency bugs are caused by non-deterministic interleavings between shared memory accesses. Their effects propagate through data and control dependences until they cause softwa...
SIMPRA
2008
14 years 10 months ago
2008
In this paper we analyze and evaluate the effects of some pre-defined process parameters on the performance of a manufacturing system. These parameters include two different plant...
IROS
2007
IEEE
15 years 4 months ago
2007
IEEE
— A new solution to the Simultaneous Localization and Modelling problem is presented. It is based on the stochastic search of solutions in the state space to the global localizat...
ECML
2007
Springer
15 years 4 months ago
2007
Springer
Abstract. The area under the ROC curve (AUC) has been widely used to measure ranking performance for binary classification tasks. AUC only employs the classifier’s scores to ra...
ISQED
2003
IEEE
15 years 3 months ago
2003
IEEE
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-...