8600 search results - page 1228 / 1720 » Measuring with Timed Patterns |
173
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AMT
2006
Springer
15 years 10 months ago
2006
Springer
In high-tech industries, most manufacturing processes are complexly intertwined, in that manufacturers or engineers can hardly control a whole set of processes. They are only capa...
174
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ATS
2004
IEEE
15 years 10 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
187
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APWEB
2006
Springer
15 years 10 months ago
2006
Springer
Discovering patterns with great significance is an important problem in data mining discipline. A serial episode is defined to be a partially ordered set of events for consecutive ...
199
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ASWEC
2006
IEEE
15 years 10 months ago
2006
IEEE
We propose a software development method for enterprise applications that combines the use of the structural concepts provided by problem frames, and the use of the UML notation. ...
141
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CSB
2004
IEEE
15 years 10 months ago
2004
IEEE
The ability to control gene expression during development in plants could be used for improving crop yields, resistance to disease, and environmental adaptability. It has been sug...